The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 05, 2023

Filed:

Sep. 30, 2021
Applicant:

Canon Kabushiki Kaisha, Tokyo, JP;

Inventors:

Toshinori Yamazaki, Tokyo, JP;

Hyochoru Tanaka, Tochigi, JP;

Shu Ito, Tochigi, JP;

Toshihiro Okuda, Tochigi, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04N 5/232 (2006.01); G03B 5/02 (2021.01); H04N 5/217 (2011.01); H04N 5/225 (2006.01); H04N 23/617 (2023.01); H04N 23/55 (2023.01); H04N 23/81 (2023.01); G02B 27/00 (2006.01); G02B 27/64 (2006.01); G03B 17/14 (2021.01);
U.S. Cl.
CPC ...
H04N 23/617 (2023.01); G03B 5/02 (2013.01); H04N 23/55 (2023.01); H04N 23/81 (2023.01); G03B 17/14 (2013.01); G03B 2205/0023 (2013.01); G03B 2205/0069 (2013.01);
Abstract

An apparatus including: a system including a correction lens unit configured to move to correct an aberration; a driving device configured to move the correction lens unit; an image pickup element configured to pick up an image formed by the system; an obtaining device configured to obtain an aberration based on a picked up image, through use of a learned model obtained by learning an image and aberration data of the system; and a controller configured to control the driving device based on the aberration, to thereby correct the aberration.


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