The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 05, 2023

Filed:

Apr. 04, 2023
Applicant:

Canon Kabushiki Kaisha, Tokyo, JP;

Inventor:

Yuki Daiku, Chiba, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04N 1/00 (2006.01);
U.S. Cl.
CPC ...
H04N 1/00013 (2013.01); H04N 1/00005 (2013.01); H04N 1/0009 (2013.01); H04N 1/00045 (2013.01); H04N 1/0066 (2013.01); H04N 1/00082 (2013.01);
Abstract

The present invention provides an inspection apparatus including a reading unit configured to read a document. The inspection apparatus compares a read image obtained by the reading unit reading a chart including a mark for acquiring distortion information printed by a printing apparatus and a reference image serving as a correct image of the chart, and generates distortion information when reading by the reading unit; and corrects, using the generated distortion information, an inspection target image obtained by the reading unit reading a printed matter from the printing apparatus; aligns the first corrected image corrected in the correcting with a reference image of the printed matter; and compares a second corrected image aligned in the aligning with a reference image of the printed matter to inspect a defect of the printed matter.


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