The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 05, 2023

Filed:

Oct. 31, 2022
Applicant:

Samsung Electronics Co., Ltd., Suwon-si, KR;

Inventors:

Hyeonju Lee, Suwon-si, KR;

Jiyoung Kim, Suwon-si, KR;

Jaehyun Park, Seoul, KR;

Seuk Son, Suwon-si, KR;

Sooeun Lee, Suwon-si, KR;

Dongchul Choi, Yongin-si, KR;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04L 7/033 (2006.01); H03K 3/037 (2006.01); H03K 5/26 (2006.01); H03K 5/00 (2006.01);
U.S. Cl.
CPC ...
H04L 7/033 (2013.01); H03K 3/037 (2013.01); H03K 5/26 (2013.01); H03K 2005/00286 (2013.01);
Abstract

A semiconductor device includes: a data sampler configured to receive a data signal having a first frequency and to sample the data signal with a clock signal having a second frequency, higher than the first frequency, to output data for a time corresponding to a unit interval of the data signal; an error sampler configured to sample the data signal with an error clock signal having the second frequency and a phase, different from a phase of the clock signal, to output a plurality of pieces of error data for the time corresponding to the unit interval; and an eye-opening monitor (EOM) circuit configured to compare the data with each of the plurality of pieces of error data to obtain an eye diagram of the data signal in the unit interval.


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