The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 05, 2023
Filed:
Jun. 03, 2022
Applicant:
Purdue Research Foundation, West Lafayette, IN (US);
Inventors:
Robert Graham Cooks, West Lafayette, IN (US);
Zane Baird, West Lafayette, IN (US);
Pu Wei, West Lafayette, IN (US);
Assignee:
Purdue Research Foundation, West Lafayette, IN (US);
Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
H01J 49/00 (2006.01); H01J 49/24 (2006.01); H01J 49/06 (2006.01); G01N 27/623 (2021.01); G01N 27/622 (2021.01); H01J 49/14 (2006.01);
U.S. Cl.
CPC ...
H01J 49/24 (2013.01); G01N 27/622 (2013.01); G01N 27/623 (2021.01); H01J 49/0013 (2013.01); H01J 49/061 (2013.01); H01J 49/142 (2013.01);
Abstract
The invention generally relates to sample analysis systems and methods of use thereof. In certain aspects, the invention provides a system for analyzing a sample that includes an ion generator configured to generate ions from a sample. The system additionally includes an ion separator configured to separate at or above atmospheric pressure the ions received from the ion generator without use of laminar flowing gas, and a detector that receives and detects the separated ions.