The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 05, 2023

Filed:

May. 16, 2022
Applicant:

Micromass Uk Limited, Wilmslow, GB;

Inventors:

Keith Richardson, High Peak, GB;

Jeffery Mark Brown, Hyde, GB;

David J. Langridge, Bollington, GB;

Assignee:

Micromass UK Limited, Wilmslow, GB;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01J 49/00 (2006.01); H01J 49/06 (2006.01); H01J 49/42 (2006.01);
U.S. Cl.
CPC ...
H01J 49/0036 (2013.01); H01J 49/067 (2013.01); H01J 49/4265 (2013.01);
Abstract

Disclosed herein are various methods and apparatus for performing charge detection mass spectrometry (CDMS). In particular, techniques are disclosed for monitoring a detector signal from a CDMS device to determine how many ions are present in the ion trap () of the CDMS device. For example, if no ions are present the measurement can then be terminated early. Similarly, if more than one ion is present, the measurement can be terminated early, or ions can be removed from the trap () until only a single ion remains. Techniques are also provided for increasing the probability of there being a single ion in the trap (). A technique for attenuating an ion beam is also provided.


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