The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 05, 2023
Filed:
Aug. 26, 2020
Goertek Inc., Shandong, CN;
Jie Liu, Shandong, CN;
Jifeng Tian, Shandong, CN;
Fuli Xie, Shandong, CN;
Shunran Di, Shandong, CN;
Yifan Zhang, Shandong, CN;
GOERTEK, INC., Shandong, CN;
Abstract
A method and device for small sample defect classification and a computing equipment are disclosed. The method comprises: separating a target to be tested into parts, and segmenting an original image of the target to be tested into at least two sub-images containing different parts according to the separated parts; establishing small sample classification models with respect to each sub-image and the original image respectively, and obtaining a classification result of each sub-image and a classification result of the original image by using corresponding classification models, wherein the classification result includes a defect category and a corresponding category probability; and determining and outputting a defect category of the target to be tested according to classification results of all the sub-images and the original image.