The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 05, 2023

Filed:

Aug. 06, 2021
Applicant:

Panasonic Intellectual Property Management Co., Ltd., Osaka, JP;

Inventors:

Nobuo Hara, Osaka, JP;

Takeshi Yamasaki, Osaka, JP;

Koichi Wakitani, Toyama, JP;

Tomoyuki Ishikawa, Yamaguchi, JP;

Seita Takahashi, Yamaguchi, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06K 9/00 (2022.01); G06T 7/00 (2017.01); G06T 7/73 (2017.01); G06V 10/42 (2022.01); G06V 10/98 (2022.01);
U.S. Cl.
CPC ...
G06T 7/001 (2013.01); G06T 7/0006 (2013.01); G06T 7/74 (2017.01); G06V 10/42 (2022.01); G06V 10/98 (2022.01); G06T 2207/30164 (2013.01); G06V 2201/06 (2022.01);
Abstract

An information processing method calculates a position of a feature corresponding to a trace in a first coordinate system, calculates a position of the feature corresponding to the trace in a second coordinate system, and calculates a size of a first distribution of the position of the feature corresponding to the trace in the first coordinate system and a size of a second distribution of the position of the feature corresponding to the trace in the second coordinate system. Additionally, the information processing method outputs information indicating that the feature corresponding to the trace is the trace formed on the surface of the workpiece in the machining process, and outputs information indicating that the feature corresponding to the trace is a false detection of the trace in the inspection process.


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