The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 05, 2023
Filed:
Sep. 22, 2020
Grading cosmetic appearance of a test object based on multi-region determination of cosmetic defects
Future Dial, Inc., Sunnyvale, CA (US);
Yan Zhou, Mountain View, CA (US);
Jisheng Li, Los Altos, CA (US);
George Huang, Los Altos Hills, CA (US);
Chen Chen, San Ramon, CA (US);
Future Dial, Inc., Sunnyvale, CA (US);
Abstract
A system and method for grading the cosmetic appearance of a test object based on multi-region determination of cosmetic defects are disclosed. The method may include grading a test object, such as, but not limited to, a computing device, for refurbishing and selling refurbished devices. In at least one embodiment, the method may include receiving, by a processing device, a plurality of images of surfaces of a test object. A region of interest in each of the plurality of images is identified and defects are identified. The cosmetic appearance of each region of interest is graded based on the identified defects and are stored. The system may include a housing with a translucent dome and a movable platform for receiving and positioning a computing device. The system may include a plurality of cameras and lights arranged to capture different views of the computing device.