The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 05, 2023
Filed:
Sep. 10, 2020
Goertek Inc., Shandong, CN;
Jie Liu, Shandong, CN;
GOERTEK, INC., Shandong, CN;
Abstract
A product defect detection method, device and system are disclosed. The product defect detection method comprises: constructing a defect detection framework including a classification network, a localization and detection network, and a judgment network, and setting a quantity of the localization and detection network and judgment rules of the judgment network according to classification results of the classification network, wherein each localization and detection network is associated with a classification result, and each judgment rule is associated with a detection result of the localization and detection network; when performing product defect detection, inputting a product image acquired into the defect detection framework, using the classification network to classify defect types in the product image, detecting defects of the product image according to a localization and detection network associated with a classification result, then judging whether the product has a defect, and detecting a defect type and a defect position.