The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 05, 2023
Filed:
Jan. 29, 2021
Deutsches Krebsforschungszentrum, Heidelberg, DE;
Yannick Berker, Bensheim, DE;
Marc Kachelrieß, Nuremberg, DE;
Deutsches Krebsforschungszentrum, Heidelberg, DE;
Abstract
A method for training of a process for generating an image of an object from measurement data modified by scatter radiation. Individual sets of measured data are each made up of matrix elements. Each matrix element corresponds to an individual detector element that detects ionizing radiation. Signals measured by the individual detector elements in an energy bin are assigned as values for each matrix element. The individual sets of measured data and a template image are used as input for a procedure for determining a correction image for correcting a modification of the measured data by the scatter radiation. The preliminary image obtained using the individual sets of measured data is adjusted to the template. These steps are repeated until the deviation between the preliminary image and the template image is below a threshold. The procedure is used to generate the image of the object from the measurement data.