The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 05, 2023

Filed:

Jan. 05, 2021
Applicant:

Fujitsu Limited, Kawasaki, JP;

Inventors:

Keivan Dabiri, Toronto, CA;

Ali Sheikholeslami, Toronto, CA;

Mehrdad Malekmohammadi, Toronto, CA;

Hirotaka Tamura, Toronto, CA;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06Q 10/04 (2023.01); G06N 7/01 (2023.01);
U.S. Cl.
CPC ...
G06Q 10/04 (2013.01); G06N 7/01 (2023.01);
Abstract

According to an aspect of an embodiment, operations may include obtaining a first fixed temperature and a second fixed temperature of a replica exchange Markov Chain Monte Carlo (MCMC) process used to solve an optimization problem associated with a system, and obtaining a plurality of replicas of the system. The operations may also include obtaining a target swap acceptance probability with respect to swapping, during the replica exchange MCMC process, between replicas that correspond to adjacently ordered temperatures of a set of temperatures between the first fixed temperature and the second fixed temperature. The operations may include determining a respective average swap acceptance probability with respect to one or more respective adjacent pairs of temperatures. Further, the operations may include adjusting one or more of the variable temperatures based on a relationship between the target swap acceptance probability and each of one or more of the respective swap acceptance probabilities.


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