The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 05, 2023

Filed:

Feb. 04, 2022
Applicant:

Canon Kabushiki Kaisha, Tokyo, JP;

Inventors:

Toshihiko Iida, Ibaraki, JP;

Yoshiji Kanamoto, Tokyo, JP;

Kimio Hayashi, Tokyo, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 3/12 (2006.01); B41J 29/393 (2006.01);
U.S. Cl.
CPC ...
G06F 3/1208 (2013.01); B41J 29/393 (2013.01); G06F 3/1207 (2013.01); G06F 3/1256 (2013.01); G06F 3/1272 (2013.01); G06F 3/1287 (2013.01); G06F 3/1204 (2013.01);
Abstract

Instruction information on quality inspection of a printed matter is acquired, and it is determined whether the instruction information identifies an inspection target by identification information of an object or by coordinate information. An inspection position is identified in accordance with the determination result, and quality inspection of the printed matter is performed by using the identified inspection position.


Find Patent Forward Citations

Iida, Toshihiko. (2023). Information processing apparatus and control method therefor (U.S. Patent No. 11836398). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/11836398

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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