The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 05, 2023

Filed:

Jun. 02, 2021
Applicant:

Nec Laboratories Europe Gmbh, Heidelberg, DE;

Inventors:

Samira Briongos, Heidelberg, DE;

Claudio Soriente, Heidelberg, DE;

Ghassan Karame, Heidelberg, DE;

Assignee:

NEC CORPORATION, Tokyo, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 21/00 (2013.01); G06F 21/53 (2013.01); G06N 20/00 (2019.01);
U.S. Cl.
CPC ...
G06F 21/53 (2013.01); G06N 20/00 (2019.01); G06F 2221/033 (2013.01);
Abstract

A method for detecting a trusted execution environment (TEE) clone application operating on a computing device includes measuring a plurality of read time periods associated with a plurality of monitored cache sets within a memory cache based on executing a first auxiliary thread of a TEE application on the computing device. Each of the read time periods indicating a time period that is used to read data within one of the monitored cache sets. The read time periods are compared with a time threshold to determine one or more cache misses. The TEE clone application is detected as operating on the computing device based on the determined cache misses.


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