The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 05, 2023

Filed:

Nov. 03, 2020
Applicant:

Veeva Systems Inc., Pleasanton, CA (US);

Inventors:

Zhen Tan, North York, CA;

Marius K. Mortensen, Burlington, CA;

Piotr Kuchnio, Toronto, CA;

Prashant Raghav, Toronto, CA;

Shanul Srivastava, Brampton, CA;

Assignee:

Veeva Systems Inc., Pleasanton, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 16/23 (2019.01); G06F 16/26 (2019.01);
U.S. Cl.
CPC ...
G06F 16/2365 (2019.01); G06F 16/26 (2019.01);
Abstract

Systems and methods are provided for managing data associated with a point-in-time architecture (PTA) databases. An exemplary method includes: receiving first data from a first PTA database and second data from a second PTA database; validating one or more parameters associated with the first data and the second data; comparing the first data and the second data with one or more reference data; predicting one or more events based on the comparing; generating a data report indicating the first data and the second data leads to the predicted one or more events; performing, based on the data report, surveillance of the first data and the second data during a surveillance period and using a surveillance protocol; receiving an update to at least one of the first data, the second data, or the one or more reference data; and updating at least one of the predicted one or more events.


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