The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 05, 2023

Filed:

Apr. 02, 2021
Applicant:

Dell Products, L.p., Round Rock, TX (US);

Inventors:

Cyril Jose, Austin, TX (US);

Jon Robert Hass, Austin, TX (US);

Michael Emery Brown, Austin, TX (US);

Choudary Maddukuri, Austin, TX (US);

Sankara Rao Gara, Cedar Park, TX (US);

Mahesh Babu Ramaiah, Geddalahalli, IN;

Sankunny Jayaprasad, Round Rock, TX (US);

Assignee:

Dell Products L.P., Round Rock, TX (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 16/22 (2019.01);
U.S. Cl.
CPC ...
G06F 16/2272 (2019.01);
Abstract

Embodiments provide unique identification of telemetry reports generated by components of an IHS (Information Handling System) that supports a plurality of metric data sources. A source of metric data is detected, where the source may be a fixed or replaceable IHS component. The metric source is identified within a device descriptor table maintained by a remote access controller of the IHS. Based on a unique user-friendly label that is associated with the metric data source in the device descriptor table, the metric source is configured to generate metric reports. The generated metric reports are received and the label provided by the metric source is used to store data from the metric reports in a database row using the label as a unique database key. The user-friendly label can be used to perform efficient database queries without using a separate database column for storing a user-friendly description of the metric source.


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