The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 05, 2023

Filed:

Aug. 09, 2021
Applicant:

Beijing Baidu Netcom Science and Technology Co., Ltd., Beijing, CN;

Inventors:

Yi Zhao, Beijing, CN;

Chaoping Ji, Beijing, CN;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 11/34 (2006.01); H04L 43/0817 (2022.01);
U.S. Cl.
CPC ...
G06F 11/3433 (2013.01); G06F 11/3414 (2013.01); H04L 43/0817 (2013.01);
Abstract

The present disclosure discloses a method and apparatus for testing a stress based on a cloud service, and relates to the field of cloud computing technology, and further to the field of cloud operation and maintenance technology. A particular implementation comprises: acquiring, based on first stress test information of a business system in a cloud service, a number of expected stress test nodes corresponding to the business system; creating edge computing nodes, a number of the edge computing nodes being identical to the number of the expected stress test nodes; and performing a stress test on the business system by using the edge computing nodes, to acquire second stress test information of the business system.


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