The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 05, 2023
Filed:
Mar. 09, 2020
Abb Schweiz Ag, Baden, CH;
Abhilash Gopalakrishnan, Bengaluru, IN;
Jithin Kizhakey Putanvetil, Kerala, IN;
Manigandan P, Gudiyattam, IN;
Arinjai Gupta, Bengaluru, IN;
Martin Nykvist, Singsby, FI;
ABB Schweiz AG, Baden, CH;
Abstract
A method for detecting a fault in an intelligent electronic device that includes components uses a Bayesian network. The method includes detecting a failure event in the components, obtaining a first list of cause of failures in the component using a fault tree model, computing probability of the cause of failures to obtain a second list of probable causes of failure by monitoring of information about the elements identified in the first list, identifying a root cause of failure associated with the element comprised in the component using the Bayesian network based on the second list, and initiating a function. The function may be one of restarting the element having the root cause of failure, a filtering operation for input data provided to that element; and providing an alert in the human machine interface associated with the intelligent electronic device.