The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 05, 2023

Filed:

Aug. 23, 2021
Applicant:

Akonia Holographics Llc, Longmont, CO (US);

Inventors:

Mark R. Ayres, Boulder, CO (US);

Adam Urness, Boulder, CO (US);

Kenneth E. Anderson, Longmont, CO (US);

Friso Schlottau, Lyons, CO (US);

Assignee:

Akonia Holographics LLC, Longmont, CO (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G02B 5/32 (2006.01); G02B 27/44 (2006.01); G03H 1/04 (2006.01); G03H 1/06 (2006.01);
U.S. Cl.
CPC ...
G02B 5/32 (2013.01); G02B 27/44 (2013.01); G03H 1/0402 (2013.01); G03H 1/06 (2013.01); G03H 2001/0436 (2013.01);
Abstract

Systems and methods for performing coherent diffraction in an optical device are disclosed. An optical device may include a grating medium with a first hologram having a first grating frequency. A second hologram at least partially overlapping the first hologram may be provided in the grating medium. The second hologram may have a second grating frequency that is different from the first grating frequency. The first and second holograms may be pair-wise coherent with each other. A manufacturing system may be provided that writes the pair-wise coherent holograms in a grating medium using a signal beam and a reference beam. Periscopes may redirect portions of the signal and reference beams towards a partial reflector, which combines the beams and provides the combined beam to a detector. A controller may adjust an effective path length difference between the signal and reference beams based on a measured interference pattern.


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