The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 05, 2023
Filed:
Dec. 16, 2020
Applicant:
Texas Instruments Incorporated, Dallas, TX (US);
Inventor:
John Charles Ehmke, Garland, TX (US);
Assignee:
TEXAS INSTRUMENTS INCORPORATED, Dallas, TX (US);
Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G02B 5/00 (2006.01); G02B 27/00 (2006.01); G02B 1/115 (2015.01); G02B 5/28 (2006.01); G02B 26/08 (2006.01);
U.S. Cl.
CPC ...
G02B 5/003 (2013.01); G02B 1/115 (2013.01); G02B 5/285 (2013.01); G02B 27/0018 (2013.01); G02B 26/0833 (2013.01);
Abstract
A system includes an optical film stack, where the optical film stack includes a substrate and a first inorganic layer on the substrate. The optical film stack also includes a first dielectric layer on the first inorganic layer and a first metal layer on the first dielectric layer. The optical film stack also includes a second dielectric layer on the first metal layer and a second inorganic layer on the second dielectric layer. The optical film stack also includes a second metal layer on the second inorganic layer.