The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 05, 2023

Filed:

Nov. 19, 2019
Applicant:

Samsung Electronics Co., Ltd., Gyeonggi-do, KR;

Inventors:

Ilpyo Hong, Gyeonggi-do, KR;

Jihee Kang, Gyeonggi-do, KR;

Jiyong Kim, Gyeonggi-do, KR;

Jihoon Kim, Gyeonggi-do, KR;

Jongin Lee, Gyeonggi-do, KR;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01R 31/26 (2020.01); G01R 29/10 (2006.01); H04B 17/10 (2015.01); H04B 17/15 (2015.01); H04B 17/29 (2015.01); G01R 31/28 (2006.01); H04B 7/06 (2006.01);
U.S. Cl.
CPC ...
G01R 29/105 (2013.01); G01R 31/2822 (2013.01); H04B 7/0617 (2013.01); H04B 17/102 (2015.01); H04B 17/15 (2015.01); H04B 17/29 (2015.01);
Abstract

An electronic device, according to one embodiment disclosed in the present disclosure, may be configured to: form a beam in any one direction of a first direction and directions rotated by a first angle on the basis of the first direction; control a device under test (DUT) so as to emit a designated signal by using the formed beam; and check antenna performance of the DUT at least on the basis of intensity measured from a signal measuring device. In addition, various embodiments inferred from the specification are also possible.


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