The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 05, 2023

Filed:

Sep. 30, 2021
Applicant:

Idexx Laboratories, Inc., Westbrook, ME (US);

Inventors:

David C. Giroux, Gorham, ME (US);

Nathanael Williams, Effingham, NH (US);

Assignee:

IDEXX Laboratories, Inc., Westbrook, ME (US);

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G01N 21/956 (2006.01); G01N 35/00 (2006.01);
U.S. Cl.
CPC ...
G01N 21/956 (2013.01); G01N 35/00623 (2013.01); G01N 2035/00673 (2013.01);
Abstract

A Z-axis measurement fixture used for testing whether a chemical reagent test slide exhibits Z-axis variability, which may affect measurements performed by an automated chemical analyzer using such test slides, includes a planar main body that holds three stainless steel balls, each ball having a known and calibrated diameter. Portions of the stainless steel balls extend outwardly from the top wall and the bottom wall of the planar main body. A chemical reagent test slide is placed on the fixture to rest on and be supported at three points by the portions of the stainless steel balls which project outwardly from the top wall of the planar main body. The fixture is placed on the surface of a gauge block of an optical measurement system such that the lower portions of the three stainless steel balls will rest on the gauge block of the optical measurement system.


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