The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 05, 2023
Filed:
Jan. 24, 2020
Carl Zeiss Meditec Ag, Jena, DE;
Carl Zeiss Meditec AG, Jena, DE;
Abstract
A microscopy system for simultaneously observing fluorescent and non-fluorescent regions of an object, and a method for operating the microscopy system are provided. The microscopy system includes a microscopy optical unit configured to image an object plane through an observation beam path onto an image plane, an observation filter arrangeable in the observation beam path, two light sources, one being provided for exciting a fluorescent dye in the object and another being provided for visualizing non-fluorescent regions of the object, and a controller to control the light sources individually. With a suitable configuration of the observation filter, all light sources can be operated with a minimum operating current, which ensures the stability of the light. The color rendering of the non-fluorescent regions can be set by the individual settability of the light sources which can be set such that fluorescent and non-fluorescent regions appear to be approximately equally bright.