The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 05, 2023

Filed:

Sep. 30, 2020
Applicant:

United States of America As Represented BY the Secretary of the Army, Alexandria, VA (US);

Inventors:

James H Lever, Lebanon, NH (US);

Susan Taylor, Lebanon, NH (US);

Garrett R Hoch, Lebanon, NH (US);

Emily Asenath-Smith, Norwich, VT (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N 19/02 (2006.01); G01N 19/08 (2006.01); G01N 21/01 (2006.01);
U.S. Cl.
CPC ...
G01N 19/02 (2013.01); G01N 19/08 (2013.01); G01N 21/01 (2013.01);
Abstract

In one embodiment, a tribometer comprises: an infrared (IR) transparent and optically transparent disk coupled to a platform, the disk having an observation side disk surface on an observation side of the disk and a contact side disk surface on a contact side of the disk; a motor coupled to the disk to rotate the disk around a rotational axis of the disk; a pivot support coupled to the platform; a pivoting member connected to the pivot support to pivot along a pivot plane; a sample holder configured to hold a sample and be coupled with the pivoting member to place the sample in contact with the contact side disk surface of the disk; and an IR camera and an optical microscope disposed on the observation side of the disk to observe the sample in sliding contact with the contact side disk surface of the disk driven in rotation.


Find Patent Forward Citations

Quick Actions:

Lever, James. (2023). Tribometer with real-time observation of interface processes (U.S. Patent No. 11835444). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/11835444

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