The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 05, 2023

Filed:

Feb. 03, 2021
Applicant:

Quality Vision International Inc., Rochester, NY (US);

Inventor:

Daniel James Lawler Williams, Rochester, NY (US);

Assignee:

Quality Vision International Inc., Rochester, NY (US);

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G01B 11/02 (2006.01); G02B 5/02 (2006.01); G02B 26/08 (2006.01);
U.S. Cl.
CPC ...
G01B 11/022 (2013.01); G02B 5/0236 (2013.01); G02B 26/0816 (2013.01);
Abstract

A video measurement system for measuring a test object comprising an imaging system comprising an imager having an imaging pupil, the imager arranged for viewing at least a portion of a silhouette of the test object by receiving light transmitted by the test object over a first angular extent; and an illumination system comprising (i) an illumination source; (ii) output having a second angular extent in object space that is larger than the first angular extent received by the imaging pupil; and (iii) a substrate arranged to diffuse light from the illumination source, the substrate having an axial centerline and a light obscuration element, wherein the light obscuration element is at least approximately coaxial to the axial centerline of the substrate, and wherein the pupils of the illumination and imaging systems are in at least approximately conjugate image planes.


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