The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 05, 2023

Filed:

Sep. 13, 2021
Applicant:

Kabushiki Kaisha Toshiba, Tokyo, JP;

Inventor:

Yoshiaki Sugizaki, Fujisawa Kanagawa, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
C12Q 1/68 (2018.01); C12Q 1/6806 (2018.01); G01N 33/543 (2006.01); C12N 9/22 (2006.01);
U.S. Cl.
CPC ...
C12Q 1/6806 (2013.01); C12N 9/22 (2013.01); G01N 33/54326 (2013.01);
Abstract

According to one embodiment, a method includes dispensing the specimen into firstto firstcontainers configured to capture the target particle, removing a contaminant other than the target particle to be captured from the specimen, adding first to m-th probes to the firstto firstcontainers, removing excessive first to m-th probes that have not bound to the target particle, individually amplifying the reporter portion for each of the firstto firstcontainers using the common primer set to obtain first to n-th amplification products, removing an excessive common primer set from the first to n-th amplification products, dispensing the first to n-th amplification products into second1 to secondcontainers respectively, amplifying the amplification products in the secondto secondcontainers using the first to m-th specific primer sets, and analyzing presence or absence or types of the target particles captured in the first1 to firstcontainers.


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