The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 05, 2023

Filed:

Dec. 14, 2020
Applicant:

Essilor International, Charenton-le-Pont, FR;

Inventors:

Zbigniew Tokarski, Dallas, TX (US);

Eric Begg, Dallas, TX (US);

Ahmed Drammeh, Dallas, TX (US);

Hao-Wen Chiu, Dallas, TX (US);

Assignee:

Essilor International, Charenton-le-pont, FR;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
B29D 11/00 (2006.01); B29B 11/02 (2006.01); B29K 101/12 (2006.01); G02C 7/02 (2006.01);
U.S. Cl.
CPC ...
B29D 11/0048 (2013.01); B29B 11/02 (2013.01); B29K 2101/12 (2013.01); G02C 7/02 (2013.01); G02C 2202/16 (2013.01);
Abstract

The present disclosure includes systems, apparatuses, and methods for an optical system. In some aspects, the systems and devices may produce a wafer for use in the manufacture of an optical article. The wafer includes a laminate having a first layer that includes a first matrix material having a lower surface and an upper surface opposite the lower surface and a second layer that includes a second matrix material, the second layer is coupled to the first layer and covers at least a portion of the lower surface or the upper surface. The first layer includes a first thickness at a central portion that is greater than a second thickness at an edge portion.


Find Patent Forward Citations

Loading…