The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 05, 2023
Filed:
Jun. 30, 2022
Mimi Hearing Technologies Gmbh, Berlin, DE;
Vinzenz Schönfelder, Berlin, DE;
Christoph Zobl, Berlin, DE;
Mimi Hearing Technologies GmbH, Berlin, DE;
Abstract
A method for conducting a cross frequency simultaneous masking (xF SM) test begins with generating a signal probe and a masker probe. The center frequencies of the signal and masker probes are separated by a fixed frequency ratio. An xF SM curve is generated by sweeping the signal and masker probes across a given frequency range, while maintaining the fixed frequency ratio between the two. While sweeping, the masker probe is maintained at a pre-determined masker amplitude or a series of pre-determined masker amplitudes. The amplitude of the signal probe is adjusted in response to a series of user inputs, which are then interpolated to generate the xF SM curve. Additionally, while sweeping, the signal probe can be maintained at one or more pre-determine amplitudes and the amplitude of the masker probe adjusted in response to user inputs, which are then interpolated to generate the xF SM curve.