The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 28, 2023

Filed:

Mar. 28, 2023
Applicant:

Sap SE, Walldorf, DE;

Inventors:

Arndt Effern, Sinsheim-Duhren, DE;

Maximilian Schmidtke, Sinsheim, DE;

Erkan Emre, Hockenheim, DE;

Assignee:

SAP SE, Walldorf, DE;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04L 12/24 (2006.01); H04L 43/08 (2022.01); H04L 41/16 (2022.01); H04L 12/26 (2006.01);
U.S. Cl.
CPC ...
H04L 43/08 (2013.01); H04L 41/16 (2013.01);
Abstract

Systems and methods include determination of training data instances associated with a respective time periods based on time-series data of each of several metrics, training of a score generator, based on the training data instances, to generate an outlier score, generation of surrogate time-series data of each of the metrics based on the time-series data of each of the metrics, determination of input data instances associated with each one of the respective time periods based on the surrogate time-series data, input of the input data instances to the trained score generator to generate an outlier score for each input data instance, determination of a threshold based on the outlier scores, identification of ones of the training data instances associated with an outlier score greater than the threshold, and identification of an anomaly associated with each of the training data instances associated with an outlier score greater than the threshold.


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