The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 28, 2023
Filed:
Feb. 01, 2021
Applicant:
Samsung Sdi Co., Ltd., Yongin-Si, KR;
Inventors:
Sang-Eun Park, Yongin-si, KR;
Young-Ugk Kim, Yongin-si, KR;
Assignee:
Samsung SDI Co., Ltd., Yongin-si, KR;
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H01M 4/36 (2006.01); H01M 4/38 (2006.01); H01M 4/58 (2010.01); H01M 10/052 (2010.01); H01M 4/134 (2010.01); H01M 4/1395 (2010.01); H01M 4/583 (2010.01); H01M 50/417 (2021.01); H01M 50/434 (2021.01); H01M 4/48 (2010.01); H01M 4/505 (2010.01); H01M 4/525 (2010.01); H01M 4/62 (2006.01); H01M 10/0525 (2010.01); H01M 10/0569 (2010.01); H01M 10/0587 (2010.01); H01M 4/02 (2006.01);
U.S. Cl.
CPC ...
H01M 10/052 (2013.01); H01M 4/134 (2013.01); H01M 4/1395 (2013.01); H01M 4/366 (2013.01); H01M 4/386 (2013.01); H01M 4/483 (2013.01); H01M 4/505 (2013.01); H01M 4/525 (2013.01); H01M 4/58 (2013.01); H01M 4/583 (2013.01); H01M 4/623 (2013.01); H01M 10/0525 (2013.01); H01M 10/0569 (2013.01); H01M 10/0587 (2013.01); H01M 50/417 (2021.01); H01M 50/434 (2021.01); H01M 2004/027 (2013.01); H01M 2004/028 (2013.01); H01M 2300/0031 (2013.01); H01M 2300/0034 (2013.01);
Abstract
A negative active material for a rechargeable lithium battery includes a core including a SiOmatrix and a Si grain, and a coating layer continuously or discontinuously coated on the core. The coating layer includes SiC and C, and the peak area ratio of the SiC (111) plane to the Si (111) plane as measured by X-ray diffraction analysis (XRD) using a CuKα ray ranges from about 0.01 to about 0.5.