The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 28, 2023
Filed:
Nov. 20, 2019
Shimadzu Corporation, Kyoto, JP;
Yukihiko Kudo, Kyoto, JP;
Shinji Sugimoto, Kyoto, JP;
SHIMADZU CORPORATION, Kyoto, JP;
Abstract
An analysis method includes analyzing a reference sample that contains a predetermined amount of a predetermined component by an analysis device using a chromatograph and obtaining a reference detection value which is a detection value of the predetermined amount of the predetermined component detected by the analysis device, calculating a judgment reference value which is a criterion for judging whether a concentration of a detection subject component in a measurement subject sample is equal to or larger than a reference concentration or equal to or smaller than the reference concentration based on the reference detection value, and analyzing the measurement subject sample by the analysis device and judging that the detection subject component has been detected in a case where a detection value exceeding the judgment reference value is detected in a peak detection time zone corresponding to the detection subject component.