The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 28, 2023
Filed:
Mar. 07, 2019
International Business Machines Corporation, Armonk, NY (US);
Matthew A. Davis, San Jose, CA (US);
Mark Kunitomi, San Francisco, CA (US);
Kun Hu, Santa Clara, CA (US);
International Business Machines Corporation, Armonk, NY (US);
Abstract
An iterative process for optimizing one or more parameters used by a k-mer based de novo genome assembler program to assemble a set of sequenced nucleic acids is described. The method utilizes quality metrics whose desired values are initially specified. Computed values of the quality metrics are calculated during the assembly process and compared to the desired values. The assembly process stops when the computed values are not desired values. After modification of one or more of the parameters (e.g., k-mer value), the assembly process re-initiates using the modified parameter set. This process repeats until the computed values of the quality metrics meet the desired values. The final parameter set is then used to generate or complete one or more final assembled genomes.