The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 28, 2023

Filed:

Oct. 31, 2017
Applicant:

Nippon Telegraph and Telephone Corporation, Chiyoda-ku, JP;

Inventors:

Yasuhiro Ikeda, Musashino, JP;

Yusuke Nakano, Musashino, JP;

Keishiro Watanabe, Musashino, JP;

Keisuke Ishibashi, Musashino, JP;

Ryoichi Kawahara, Musashino, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06N 3/08 (2023.01); G06F 17/16 (2006.01); G06N 5/022 (2023.01); G06F 18/214 (2023.01);
U.S. Cl.
CPC ...
G06N 3/08 (2013.01); G06F 17/16 (2013.01); G06F 18/2155 (2023.01); G06N 5/022 (2013.01);
Abstract

A feature value generation device includes a generator configured to digitize non-numerical text data items collected at a plurality of timings from a target of anomaly detection, to generate vectors whose elements are feature values corresponding to the digitized data items; a learning unit configured to learn the vectors during a learning period so as to output a learning result; and a detector configured to detect, during a test period, for each of the vectors generated by the generator, an anomaly based on said each of the vectors and the learning result.


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