The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 28, 2023

Filed:

Dec. 23, 2020
Applicant:

Samsung Electronics Co., Ltd., Suwon-si, KR;

Inventor:

Hyoa Kang, Seoul, KR;

Assignee:
Attorney:
Int. Cl.
CPC ...
G06V 30/194 (2022.01); G06V 10/82 (2022.01); G06N 3/04 (2023.01); G06N 3/084 (2023.01); G06F 18/21 (2023.01); G06F 18/214 (2023.01); G06F 18/232 (2023.01); G06F 18/2413 (2023.01); G06V 30/19 (2022.01);
U.S. Cl.
CPC ...
G06N 3/04 (2013.01); G06F 18/214 (2023.01); G06F 18/217 (2023.01); G06F 18/232 (2023.01); G06F 18/2414 (2023.01); G06N 3/084 (2013.01); G06V 10/82 (2022.01); G06V 30/194 (2022.01); G06V 30/1916 (2022.01); G06V 30/19147 (2022.01); G06V 30/19173 (2022.01);
Abstract

A training method of a neural network, and a recognition method and apparatus using the neural network are disclosed. The recognition method using the neural network includes obtaining a feature vector generated from a hidden layer of the neural network, in response to data being entered to an input layer of the neural network, and determining a reliability of a recognition result for the data using the feature vector and clusters.


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