The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 28, 2023
Filed:
Oct. 12, 2022
Canon Kabushiki Kaisha, Tokyo, JP;
Hirotomo Tanaka, Chiba, JP;
CANON KABUSHIKI KAISHA, Tokyo, JP;
Abstract
An inspection apparatus registers, as a reference image, image data generated based on a print job or image data obtained by scanning a printed sheet. The inspection apparatus sets a determination criterion value used in an inspection of a printed material to determine quality of the printed material and determines, in an inspection method for inspecting the printed material using the registered reference image which is based on image data generated based on a print job, quality of the printed material based on a difference between scanned image data that is obtained by scanning the print material and the registered reference image and on the determination criterion value. The inspection apparatus controls updating of the registered reference image based on a result of the determination.