The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 28, 2023
Filed:
Mar. 26, 2021
Siemens Healthineers International Ag, Steinhausen, CH;
Pascal Paysan, Steinhausen, CH;
Michal Walczak, Steinhausen, CH;
Liangjia Zhu, Palo Alto, CA (US);
Toon Roggen, Steinhausen, CH;
Stefan Scheib, Steinhausen, CH;
SIEMENS HEALTHINEERS INTERNATIONAL AG, Steinhausen, CH;
Abstract
Embodiments described herein provide for determining a probability distribution of a three-dimensional point in a template feature map matching a three-dimensional point in space. A dual-domain target structure tracking end-to-end system receives projection data in one dimension or two dimensions and a three-dimensional simulation image. The end-to-end system extracts a template feature map from the simulation image using segmentation. The end-to-end system extracts features from the projection data, transforms the features of the projection data into three-dimensional space, and sequences the three-dimensional space to generate a three-dimensional feature map. The end-to-end system compares the template feature map to the generated three-dimensional feature map, determining an instantaneous probability distribution of the template feature map occurring in the three-dimensional feature map.