The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 28, 2023
Filed:
Apr. 14, 2021
Applicant:
Shimadzu Corporation, Kyoto, JP;
Inventor:
Satoru Watanabe, Kyoto, JP;
Assignee:
Shimadzu Corporation, Kyoto, JP;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 16/00 (2019.01); G06F 16/245 (2019.01); G06F 16/248 (2019.01);
U.S. Cl.
CPC ...
G06F 16/245 (2019.01); G06F 16/248 (2019.01);
Abstract
An analysis assistance device includes an estimator that estimates distribution of measurement quality index data using a plurality of analysis condition data to be provided to an analysis device and a plurality of measurement data obtained in the analysis device based on the plurality of analysis condition data, a calculator that calculates the measurement quality index data from the measurement data obtained from the analysis device, and a comparison outputter that compares and outputs for display the measurement quality index data estimated by the estimator and the measurement quality index data calculated by the calculator.