The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 28, 2023

Filed:

Jul. 28, 2014
Applicant:

Hewlett Packard Enterprise Development Lp, Houston, TX (US);

Inventors:

Rotem Chen, Yehud, IL;

Hava Babay Adi, Yehud, IL;

Yifat Felder, Yehud, IL;

Ran Biron, Sunnyvale, CA (US);

Assignee:

Micro Focus LLC, Santa Clara, CA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 16/23 (2019.01); G06F 16/22 (2019.01); G06F 11/08 (2006.01); G06F 17/00 (2019.01); G06F 11/34 (2006.01); G06F 11/00 (2006.01);
U.S. Cl.
CPC ...
G06F 16/2379 (2019.01); G06F 11/00 (2013.01); G06F 11/08 (2013.01); G06F 11/34 (2013.01); G06F 16/2246 (2019.01); G06F 16/2365 (2019.01); G06F 17/00 (2013.01);
Abstract

Examples relate to detecting an abnormality. The examples disclosed herein enable receiving, from a first user, a first request to perform a first transaction on at least one data record. A plurality of transactions originated from the first request may be organized in a first hierarchical tree-based data structure having multiple depth levels. The data structure may comprise a root node representing the first transaction and a leaf node representing a second transaction. The examples further enable detecting the abnormality based on at least one parameter where the at least one parameter comprises a size of the data structure and a depth level associated with the leaf node.


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