The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 28, 2023
Filed:
Apr. 26, 2022
Hamilton Sundstrand Corporation, Charlotte, NC (US);
Kirk A. Lillestolen, East Hartford, CT (US);
William E. Villano, Canton, CT (US);
Hamilton Sundstrand Corporation, Charlotte, NC (US);
Abstract
A computing method and device for detecting an anomaly event in a hardware- based machine learning anomaly event detector. Data is received from a plurality of input/output interfaces (I/O) or internal functions, wherein the received data of each I/O is associated with a certain sensor or effector. The received data from the plurality of I/O's is analyzed to determine the occurrence of an anomaly event for data from one of the plurality of I/O's. This analysis includes using machine learning techniques dynamically programmed to detect an anomaly event for the I/O data being analyzed by using predetermined parameter values. The predetermined parameter values are retrieved from memory, and are associated with the I/O data being analyzed. Stored in memory for subsequent analysis is at least a portion of the received data from the I/O data being analyzed accompanied with associated neural network output when it is determined an anomaly event occurred for the I/O data being analyzed using the machine learning techniques.