The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 28, 2023

Filed:

Feb. 28, 2022
Applicant:

Hitachi, Ltd., Tokyo, JP;

Inventors:

Satish Kumar Jaiswal, Tokyo, JP;

Mineyoshi Masuda, Tokyo, JP;

Assignee:

HITACHI, LTD., Tokyo, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 11/00 (2006.01); G06F 11/07 (2006.01);
U.S. Cl.
CPC ...
G06F 11/0751 (2013.01); G06F 11/0721 (2013.01);
Abstract

To improve promptness of anomaly detection after occurrence of an event, provided is an anomaly detection apparatus including a processor that executes a program and a storage device that stores the program. The processor executes a correction process of applying a scale transformation to correct second predicted data in time-series first predicted data of a monitoring target, the second predicted data including data after occurrence time of a specific event, and a detection process of detecting an anomaly of the monitoring target based on the second predicted data corrected in the correction process and based on second measured data in time-series first measured data of the monitoring target, the second measured data including data after the occurrence time of the specific event.


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