The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 28, 2023
Filed:
Mar. 13, 2023
Skydio, Inc., Redwood City, CA (US);
Peter Henry, San Francisco, CA (US);
Jack Zhu, San Francisco, CA (US);
Brian Richman, San Francisco, CA (US);
Harrison Zheng, Palo Alto, CA (US);
Hayk Martirosyan, San Francisco, CA (US);
Matthew Donahoe, Redwood City, CA (US);
Abraham Bachrach, Redwood City, CA (US);
Adam Bry, Redwood City, CA (US);
Ryan David Kennedy, Redwood City, CA (US);
Himel Mondal, Windsor, CA;
Quentin Allen Wah Yen Delepine, Cupertino, CA (US);
SKYDIO, INC., Redwood City, CA (US);
Abstract
In some examples, an unmanned aerial vehicle (UAV) may identify a scan target. The UAV may navigate to two or more positions in relation to the scan target. The UAV may capture, using one or more image sensors of the UAV, two or more images of the scan target from different respective positions in relation to the scan target. For instance, the two or more respective positions may be selected by controlling a spacing between the two or more respective positions to enable determination of parallax disparity between a first image captured at a first position and a second image captured at a second position of the two or more positions. The UAV may determine a three-dimensional model corresponding to the scan target based in part on the determined parallax disparity of the two or more images including the first image and the second image.