The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 28, 2023

Filed:

Apr. 22, 2020
Applicant:

Dassault Systemes Simulia Corp., Johnston, RI (US);

Inventors:

Alexander Jacobus Maria Van der Velden, Atlanta, GA (US);

Jing Bi, Foxborough, MA (US);

Subham Sett, Lincoln, RI (US);

Assignee:

Dassault Systemes Simulia Corp., Johnston, RI (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G05B 13/04 (2006.01); G06N 20/00 (2019.01); B22F 10/00 (2021.01); G05B 19/4099 (2006.01); G06F 30/10 (2020.01); B33Y 50/02 (2015.01); B29C 64/153 (2017.01); B29C 64/393 (2017.01); G06F 30/27 (2020.01); G06F 119/18 (2020.01); G06F 111/18 (2020.01); G06F 113/10 (2020.01);
U.S. Cl.
CPC ...
G05B 19/4099 (2013.01); B22F 10/00 (2021.01); B29C 64/153 (2017.08); B29C 64/393 (2017.08); B33Y 50/02 (2014.12); G05B 13/048 (2013.01); G06F 30/10 (2020.01); G06F 30/27 (2020.01); G06N 20/00 (2019.01); G05B 2219/49023 (2013.01); G06F 2111/18 (2020.01); G06F 2113/10 (2020.01); G06F 2119/18 (2020.01);
Abstract

A method includes simulating a process, with computer-based software, to produce virtual data about the process; identifying process parameters for a real-world version of the process; providing a real-world sensor to sense a parameter associated with the real-world version of the process; receiving sensor readings from the real-world sensor while the real-world version is being performed; and training a machine-learning software model to predict a behavior of the real-world sensor based on the virtual data about the process, the process parameters, and the sensor readings.


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