The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 28, 2023

Filed:

Feb. 26, 2021
Applicants:

Interface Technology (Chengdu) Co., Ltd., Chengdu, CH;

Interface Optoelectronics (Shenzhen) Co., Ltd., Shenzhen, CN;

Interface Optoelectronics (Wuxi) Co., Ltd., Wu Xi, CN;

General Interface Solution Limited, Miaoli County, TW;

Inventor:

Che Wen Chiang, Shenzhen, CN;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G02F 1/13 (2006.01); G01N 21/21 (2006.01); G01N 21/49 (2006.01);
U.S. Cl.
CPC ...
G02F 1/1309 (2013.01); G01N 21/21 (2013.01); G01N 21/49 (2013.01); G01N 2201/0231 (2013.01); G01N 2201/121 (2013.01);
Abstract

An optical environment oscillation detection system and an optical measurement method using the same are provided. This system includes a laser light source, a polarizer, a liquid crystal (LC) element, an analyzer, and an optical sensor arranged in sequence. A polarization axis of the polarizer and that of the analyzer are respectively parallel to a first and a second axis direction being perpendicular to each other. When there is no environmental disturbance, the alignment of LC cells in the LC element has an original pretilt angle, and the optical sensor senses a first scattered light intensity of the laser beam outputted from the analyzer. When there is environmental disturbance, the alignment of the LC cells has a changed pretilt angle in relative to the original pretilt angle, and the optical sensor senses a second scattered light intensity of the laser beam outputted from the analyzer.


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