The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 28, 2023

Filed:

Mar. 28, 2022
Applicant:

Rohde & Schwarz Gmbh & Co. KG, Munich, DE;

Inventors:

Mert Celik, Munich, DE;

Hendrik Bartko, Munich, DE;

Benoit Derat, Munich, DE;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01R 27/28 (2006.01); G01R 31/302 (2006.01); G01R 31/317 (2006.01); G01R 31/319 (2006.01);
U.S. Cl.
CPC ...
G01R 31/3025 (2013.01); G01R 31/31713 (2013.01); G01R 31/31908 (2013.01); G01R 31/31917 (2013.01);
Abstract

A system for over-the-air testing of a device under test includes a measurement antenna, a reference antenna, a device under test capable of wirelessly transmitting and/or receiving complex radio frequency signals, and an analyzer. The analyzer has at least two ports, wherein the reference antenna is connected with a first port of the analyzer. The measurement antenna is connected with a second port of the analyzer. The analyzer is capable of determining a phase difference and a power ratio of radio frequency signals received via the measurement antenna and the reference antenna. The analyzer is capable of performing an IQ analysis on complex radio frequency signals. Further, a method of over-the-air testing of a device under test is disclosed.


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