logo

For the Inventor, By the Inventor

The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 11828793 B1

PDFFull Text
Date of Patent:
Nov. 28, 2023

Filed:

Aug. 26, 2021

Testing apparatus for temperature testing of electronic devices

Applicant:

Western Digital Technologies, Inc., San Jose, CA (US);

Inventors:

Ba Duong Phan, North Tustin, CA (US);

Alireza Daneshgar, Irvine, CA (US);

Assignee:

Western Digital Technologies, Inc., San Jose, CA (US);

Attorney:

Barry IP Law, P.C.

Primary Examiner:

Neel D Shah

Int. Cl.
CPC ...
G01R 1/02 (2006.01); G01R 1/04 (2006.01); G01R 1/067 (2006.01); G01R 1/073 (2006.01); G01R 31/28 (2006.01); G05B 15/02 (2006.01); G06F 1/20 (2006.01); G01R 1/44 (2006.01);
U.S. Cl.
CPC ...
G01R 31/287 (2013.01); G01R 1/04 (2013.01); G01R 1/44 (2013.01);
Abstract

A testing apparatus for Devices Under Test (DUTs) includes at least one intake damper and at least one exhaust damper. At least one fan moves recirculated fluid and exterior fluid across one or more DUTs inside the testing apparatus. In one aspect, the testing apparatus includes a door to provide access to a chamber and the door includes at least one channel. At least a portion of the fluid flows through the at least one channel of the door. In another aspect, the door is configured to provide access to a chamber from the front of the chamber and the fluid is moved in a direction across the one or more DUTs substantially from the front of the chamber towards a rear of the chamber.

Find Patent Forward Citations

Phan, Ba. (2023). Testing apparatus for temperature testing of electronic devices (U.S. Patent No. 11828793). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/11828793

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Loading…