The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 28, 2023
Filed:
Aug. 05, 2022
Applicant:
Kioxia Corporation, Tokyo, JP;
Inventors:
Assignee:
Kioxia Corporation, Tokyo, JP;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01Q 30/02 (2010.01); G01N 21/35 (2014.01); G01Q 60/24 (2010.01);
U.S. Cl.
CPC ...
G01Q 30/02 (2013.01); G01N 21/35 (2013.01); G01Q 60/24 (2013.01);
Abstract
A sample for atomic force microscopy-based infrared spectroscopy includes a substrate, a measurement portion provided on the substrate and having a first light absorption intensity when a light of a first wavelength is irradiated thereon, and a first film provided on the measurement portion and having a higher coefficient of thermal expansion than the measurement portion and a second light absorption intensity, which is less than the first light absorption intensity, when the light of the first wavelength is irradiated thereon.
Ito, Machiko. (2023). Sample, method for manufacturing sample, and method for measuring infrared absorption spectrum (U.S. Patent No. 11828772). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/11828772
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile