The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 28, 2023

Filed:

Mar. 01, 2022
Applicant:

Metrohm Spectro, Inc., Plainsboro, NJ (US);

Inventor:

Jun Zhao, Plainsboro, NJ (US);

Assignee:

METROHM SPECTRO, INC., Plainsboro, NJ (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01J 3/02 (2006.01); G01J 3/44 (2006.01); G01N 21/65 (2006.01); G01N 21/27 (2006.01); G01J 3/28 (2006.01); G01N 21/47 (2006.01);
U.S. Cl.
CPC ...
G01J 3/0297 (2013.01); G01J 3/0286 (2013.01); G01J 3/28 (2013.01); G01J 3/44 (2013.01); G01J 3/4412 (2013.01); G01N 21/274 (2013.01); G01N 21/65 (2013.01); G01N 21/4785 (2013.01);
Abstract

A device for performing Raman spectroscopy measurements that incorporate Raman Shift calibration and related method for carrying out the Raman Shift calibration are disclosed. The device comprises of one or more Raman shift reference materials with one or more Raman bands, the positions of which are pre-determined to a high degree of accuracy within a useful temperature range. The device further comprises a sensor to measure the temperature of the one or more reference materials to provide accurate reference values for the Raman shift calibration. When used with the measured spectrum of the reference materials, an accurate Raman Shift calibration function of the device can be generated.


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