The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 28, 2023

Filed:

May. 02, 2022
Applicant:

Virtek Vision International Inc., Waterloo, CA;

Inventors:

Kurt D. Rueb, Kitchener, CA;

Jeff Erbrecht, Waterloo, CA;

Marc Cameron, Waterloo, CA;

Elizabeth McAndless, Kitchener, CA;

Assignee:
Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G03B 21/14 (2006.01); H04N 9/31 (2006.01); G01C 11/14 (2006.01); G01C 15/00 (2006.01);
U.S. Cl.
CPC ...
G01C 11/14 (2013.01); G01C 15/004 (2013.01); H04N 9/3161 (2013.01); H04N 9/3194 (2013.01);
Abstract

A system and method for aligning projection of an optical indicia on a surface of a large object is disclosed. A reference is disposed in proximity to the object. The reference includes a plurality of markers spaced at intermittent locations. A projection system projects optical indicia onto the surface of the object. A detection system detects the markers disposed upon the reference and signals an image of the markers to a processor for the processor to register a location of the projection system relative to the reference. The reference is aligned with a feature disposed upon the object enabling registration of the markers to the object. A location of the projection system relative to the object is established enabling the projection system to project the optical indicia onto the object to a predetermined location.


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