The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 28, 2023

Filed:

Nov. 06, 2019
Applicant:

Micro-epsilon Messtechnik Gmbh & Co. KG, Ortenburg, DE;

Inventor:

Gerhard Kirschner, Passau, DE;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01B 11/06 (2006.01); B21B 38/04 (2006.01);
U.S. Cl.
CPC ...
G01B 11/06 (2013.01); B21B 38/04 (2013.01);
Abstract

With regard to a reliable measurement of the thickness of an object () even in an environment with high temperatures, a device () is provided for determining the thickness of an object (), more particularly a strip-like or flat object (), preferably for use in a hot rolling process, having a frame () with at least one leg (), the at least one leg () having a sensor () for the contactless measuring of the distance to the object (), which device is characterised in that the at least one leg () has a structure consisting of a plurality of layers in order to reduce the temperature effect on the frame () and/or on the sensor ().


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