The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 28, 2023

Filed:

Jan. 16, 2017
Applicants:

Shenzhen Mindray Bio-medical Electronics Co., Ltd., Guangdong, CN;

Shenzhen Second People's Hospital, Guangdong, CN;

Inventors:

Huifang Wang, Shenzhen, CN;

Yongquan Lai, Shenzhen, CN;

Yaoxian Zou, Shenzhen, CN;

Muqing Lin, Shenzhen, CN;

Zhijie Chen, Shenzhen, CN;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
A61B 8/08 (2006.01); A61B 8/00 (2006.01); A61B 5/00 (2006.01);
U.S. Cl.
CPC ...
A61B 8/085 (2013.01); A61B 5/7267 (2013.01); A61B 8/463 (2013.01); A61B 8/467 (2013.01);
Abstract

A method for measuring parameters in an ultrasonic image, comprising: acquiring an ultrasonic image, the image comprising a target tissue; an ultrasound probe obtaining an ultrasonic image by means of receiving an ultrasound signal from the target tissue; displaying the ultrasonic image; obtaining a measurement instruction on the basis of the ultrasonic image; calculating a related measurement item of the target tissue according to the measurement instruction and obtaining a calculation result; and outputting the calculation result. Further provided is a system for measuring parameters in an ultrasonic image. The method and system solve the problem wherein ultrasonic image measurement operations are inconvenient.


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