The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 21, 2023

Filed:

Nov. 18, 2019
Applicant:

Verizon Patent and Licensing Inc., Arlington, VA (US);

Inventors:

Raghuram Parvataneni, Edison, NJ (US);

Kirk Campbell, Long Valley, NJ (US);

Anil K. Guntupalli, Irving, TX (US);

Ravi Sharma, Freehold, NJ (US);

Assignee:

Verizon Patent and Licensing Inc., Basking Ridge, NJ (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04W 24/06 (2009.01); H04L 41/0803 (2022.01); H04L 43/16 (2022.01); H04L 43/065 (2022.01); H04L 43/045 (2022.01); H04L 43/50 (2022.01);
U.S. Cl.
CPC ...
H04W 24/06 (2013.01); H04L 41/0803 (2013.01); H04L 43/045 (2013.01); H04L 43/065 (2013.01); H04L 43/16 (2013.01); H04L 43/50 (2013.01);
Abstract

A computer device may include a memory storing instructions and processor configured to execute the instructions to provide a test configuration to a plurality of multi-access edge computing (MEC) devices; collect test results associated with the provided test configuration from the plurality of MEC devices; and obtain capability information associated with particular ones of the plurality of MEC devices. The computer device may be further configured to generate a test report that relates one or more parameters included in the test results and the obtained capability information to particular ones of the plurality of MEC devices; and use the generated test report to select a MEC device from the plurality of MEC devices for a user equipment (UE) device requesting an application session.


Find Patent Forward Citations

Loading…